OJSC "Planar-SO": EM-6080 Probe Testing System

220033, Republic of Belarus, Minsk, Partizansky Prospekt, 2-1a, Office 206A

Tel. +375 (29) 621 79 05

Let out production:

The EM-6080 probe testing system provides: electrical contact between the Buyer's measuring circuits and the contact pads of the integrated circuit (IC) crystals on the wafer according to a preset bypass program; semi-automatic operation (wafer loading manually); the ability to simultaneously test multiple crystals (multi-site); automatic movement across individual crystals at a preset step according to the bypass program (map); rechecking of previously rejected crystals before marking; marking without measurements according to the suitability chart; display of test results on the monitor; storage of bypass program settings and test codes in memory; the system features a "soft" contact mode.

Online address: www.kbtem.by/products/probe-control/em-6080

The EM-6080 probe testing system is designed to establish electrical contact between the customer's measuring circuits and the contact pads of integrated circuit chips on semiconductor wafers. The maximum diameter of the tested wafers is 200 mm. Die size, mm: from 0.4 x 0.4 to 20 x 20. Power consumption, kW: no more than 0.8. The system's electronics and software allow for on-site retraining for a different product, while maintaining the system's parameters for operation in multi-product manufacturing environments.